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MiPlaza Materials Analysis
Surface & Thin Film Analysis


 

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  • Analysis of the chemical composition and morphology of surfaces and thin films.
  • Depth profiling of main constituents and dopants or contaminations.
  • Determination of dopant profiles in silicon wafers and contaminants on the surface.
  • Micro- and nanostructural analysis of semiconductor devices, thin film and bulk materials.

Typical examples

+ Coatings (PDF; 128 KB)
+ Etching artefacts (PDF; 223 KB)
+ Polymer LEDs (PDF; 2297 KB)
+ Spin-tunneling sensor in magnetic read heads (PDF; 625 KB)
+ Microstructure vs electrical properties (PDF; 229 KB)
+ Polymer Solar Cells Characterization (PDF; 1415 KB)

+ Uniformity of phase-change layers (PDF; 553 KB)

+ Cryo-TEM studies of liposomes


 

Techniques used

SSIMS, DSIMS, XPS/ESCA, SAM/AES, SEM/EPMA, RBS/ERD/Channelling, TEM, FIB, Optical Profilometry.

Read more:
+ Publications Materials Analysis
 

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 Picture Surface & Thin Film Analysis