MiPlaza Materials Analysis
Surface & Thin Film Analysis


 

Expertise
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  • Chemical composition of surfaces and thin films.
  • Depth profiling of main constituents and dopants or contaminations.
  • Characterization of interfaces.
  • Morphology and microstructure of (patterned) thin films and whole products.
  • Cross-sectioning with nanoprecision and nanomachining.


Typical examples

+ Coatings (PDF; 128 KB)
+ Etching artefacts (PDF; 500 KB)
+ Polymer LEDs (PDF; 2297 KB)
+ Spin-tunneling sensor in magnetic read heads (PDF; 625 KB)
+ Microstructure vs electrical properties (PDF; 229 KB)
+ Polymer Solar Cells Characterization (PDF; 1415 KB)

+ Uniformity of phase-change layers (PDF; 553 KB)

+ Cryo-TEM studies of liposomes


 

Techniques used

SSIMS, DSIMS, XPS/ESCA, SAM/AES, SEM/EPMA, RBS/ERD/Channelling, TEM, FIB, Optical Profilometry, XRT.

Read more:
+ Publications Materials Analysis
 

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 Picture Surface & Thin Film Analysis